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ET-100 Emissometer

Total Hemispherical Emittance Measurements

The ET-100 measures directional reflectance from 1.5 to 21 μm and, based on those values, calculates directional and total hemispherical emissivity. The ET-100 emissometer conforms to ASTM E408, the standard test method for the determination of emittance using a portable instrument. In-band reflectance data for six discrete bands.

Characterizing materials for:

  • IR signature management
  • Low observable coatings
  • Radiative heat transfer
  • Emissivity for thermal modeling
  • Thermal camera calibration
  • Wafer fab hardware emissivity

 

Measured Parameter

Directional hemispherical reflectance (DHR)

Method

Integrated total reflectance in a band for a given angle of incidence

Measured Value

Absolute reflectance (0-1)

Calculated Value

Directional thermal emissivity at 20º, directional thermal emissivity at 60º,
hemispherical thermal emissivity

Wavelength Bands (microns)

1.5-2.0, 2.0-3.5, 3.0-4.0, 4.0-5.0, 5.0-10.5, 10.5-21

Angle of Incidence

20º & 60º from normal incidence

Calibration Coupon

Specular Gold

Accuracy

+/- .03

Repeatability

± .005 units

Beam Spot Size

0.50 inches

Measurement Time

10 sec

Sample Size & Geometry

Flat: ≥ 0.5 in. diameter

Curved: 6 in. convex; 12 in. concave

Warm Up Time

90 seconds

Time Between Measurements

2 seconds

Sample Temperature

Ambient or heated/cooled to 0 – 100º C

Operating Temp

0º to 40º C

Storage Temp

-25º to 70ºC

Run Time

2 hours on one battery. Battery easily replaced with continuous operation after battery replacement.

Power Source

Rechargeable battery (standard environmentally friendly NiMH)

Battery Recharge Time

1 hour

IR Source

Kanthal filament operated at about 1,000ºC

Weight

4.7 lb

Form Factor

H 11.54”, L 9.04”, W 3.27” (29.31 cm x 22.96 cm x 9.44 cm)

Operator Interface

LCD graphics screen, 1/4 VGA, touch screen, software buttons; trigger switch in handle

Software Applications

Pass/fail can be incorporated, user set values

Diagnostics

On screen status and signals monitor. Signal values stored with data. Raw data collection and display.

Data Format

Data files can be opened and post processed with Excel or a text processor

Data Storage

Removable SanDisk (SD) card

ASTM Standard

E903

Export Control

ECCN #3A999.F

Standard ET100 Components

  • Command Module with safety strap
  • ET100 Measurement Head with port cap
  • Specular Gold Calibration coupon in storage container (Non-NIST traceable)
  • SecureDigital card reader on a USB cable
  • SecureDigital card for data storage, 4 GB
  • ET100 operating software
  • 12 Volt battery cartridge – 2 batteries total
  • Battery charger
  • Pelican Case shipping/storage container
  • Accessories container
  • 1-year warranty
  • Worldwide support

Optional ET100 Components

  • Benchtop Remote Control Unit – 220VAC
  • Benchtop Remote Control Unit – 120VAC
  • Specular Gold Calibration Coupon (NIST Traceable)
  • ET100 Reflectometer Maintenance and Calibration Plan (Non-NIST)
  • ET100 Reflectometer Maintenance and Calibration Plan (NIST)
  • ET100 Extended Warranty
  • SD Card for Extra Data Storage
  • Handheld Command Module – 220VAC
What is the difference in the emissivity measurements provided by the 410-DHR, ET10 and ET100?

All three models measure directional hemispherical reflectance (DHR). The 410-DHR and ET10 provide in-band emittance for thir spectral bands using the calculation of one minus reflectance, or E = 1 – DHR. The ET100 uses the DHR to provide in-band emittance values plus a single value for directional emittance at 20 degrees, directional emittance at 60 degrees, and total hemispherical emittance.

 

Is there a way to extrapolate higher temperature emissivity from room temperature measurements?

The basic property measured by the ET100 is reflectance. Since reflectance is a physical constant, temperature independent, it can be used to determine an accurate emissivity value if the interrogated surface does not undergo a physical or a chemical change between the measurement at ambient temperature and the high temperature. The ET100 measures emissivity of an object at ambient temperature, and the user sets in the instrument the desired higher temperature, and it will calculate emissivity for that temperature.

 

 

Why do I need to select if the sample is metal or dielectric?

The metal and dielectric look up tables store values of a correlation factor for a range of Directional Thermal Emissvity (DTE) 20°. This correlation factor defines the relationship between DTE20° and THE and it is different for metals versus dielectrics. DTE20° is measured and multiplied by the correct correlation factor to yield THE. DTE60° is not used in this calculation.

 

 

How is the Total Hemispherical Emissivity (THE) calculated?

The near normal directional emissivity values are used to derive total total hemispherical emissivity utilizing correlations published Siegel and Howell, Thermal Radiation Heat Transfer, Taylor and Francis, 1992. The ratio of total hemispherical emittance to near-normal directional thermal emittance is plotted as a function of near-normal directional thermal emittance. There is a curve for metals and a curve for dielectrics. These correlations are stored as tables in the ET100 software and used to calculate total hemispherical emittance from the measured near-normal directional thermal emittance. While the ET100 measures directional thermal emissivity at 20 and 60 degrees angle of incidence, only the DTE20° is used to calculate the total hemispherical emissivity.

 

 

Which test method from ASTM E408 applies to the ET100?

Test Method C.